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| TI Ref No : | 519064545 |
|---|---|
| Description : | Supply And Installation Of An Electronic Scanning Microscope With Fib (focused Ion Beam), X -ray Analysis System And Mass Ablation System Of Material By Clustered Laser, Destined For The Institute Of Microelectronics Of Seville Of The State Agency Higher |
| Date : | 2025-06-12 |
| Deadline : | 2025-07-14 |
| Document Type : | Tenders |
