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| TI Ref No : | 525660052 |
|---|---|
| Description : | Contract Awarded For Manual After Develop Inspection Tool And Auto Defect Inspection Tool And The Oqa Aoi Equipment Is For Wafer Outgoing Auto Optical Inspection Before Wafer Package And Shipping. xinlian Microelectronics Company Limited Defect Detection |
| Date : | 2025-11-30 |
| Deadline : | 2026-01-10 |
| Document Type : | Contracts |
