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| TI Ref No : | 524961322 |
|---|---|
| Description : | Contract Awarded For Surface Inspection System For Defect Detection On Wafers (hhi-05) - Pr880078-3220-p surface Inspection System For Defect Detection On Wafers (hhi-05) value Of The Result: winner Selection Date : date Of Conclusion Of The Contract |
| Date : | 2025-11-11 |
| Deadline : | 2026-01-17 |
| Document Type : | Contracts |
