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| TI Ref No : | 519611237 |
|---|---|
| Description : | Contract Awarded For Systems For The Characterization Of The Crystallographic Quality And The Defect Of Semiconductors Divided Into Two Lots_lot 1 Cig B2eb2e6c8 Raggi Diffractometer X_lotto 2 Cig B2eb2ef79b Spectrometer systems For The Characterization Of |
| Date : | 2025-06-25 |
| Deadline : | 2025-09-16 |
| Document Type : | Contracts |
